An Echo State Network-Based Light Framework for Online Anomaly Detection: An Approach to Using AI at the Edge

Production efficiency is used to determine the best conditions for manufacturing goods at the lowest possible unit cost. When achieved, production efficiency leads to increased revenues for the manufacturer, enhanced employee safety, and a satisfied customer base. Production efficiency not only measures the amount of resources that are needed for production but also considers the productivity levels and the state of the production lines. In this context, online anomaly detection (AD) is an important tool for maintaining the reliability of the production ecosystem. With advancements in artificial intelligence and the growing significance of identifying and mitigating anomalies across different fields, approaches based on artificial neural networks facilitate the recognition of intricate types of anomalies by taking into account both temporal and contextual attributes. In this paper, a lightweight framework based on the Echo State Network (ESN) model running at the edge is introduced for online AD. Compared to other AD methods, such as Long Short-Term Memory (LSTM), it achieves superior precision, accuracy, and recall metrics while reducing training time, CO2 emissions, and the need for high computational resources. The preliminary evaluation of the proposed solution was conducted using a low-resource computing device at the edge of the real production machine through an Industrial Internet of Things (IIoT) smart meter module. The machine used to test the proposed solution was provided by the Italian company SIFIM Srl, which manufactures filter mats for industrial kitchens. Experimental results demonstrate the feasibility of developing an AD method that achieves high accuracy, with the ESN-based framework reaching (Formula presented.) compared to (Formula presented.) for the LSTM-based model. Furthermore, this method requires minimal hardware resources, with a training time of (Formula presented.) s compared to (Formula presented.) s for the other model.