In recent years, great attention has been devoted to the study and realization of polymeric optical waveguides embedded in printed circuit boards due to the increasing need of transferring large amounts of data at high speed within computer and telecommunication devices. Nonuniform microstructural defects that can be induced during the manufacturing process can dramatically influence the waveguide performance. The synchrotron radiation computed microtomography technique was used to obtain 3-D microstructural information, specifically to observe small defects, such as porosities, in a nondestructive way. Porosity level and pore size range were evaluated.
Defect analysis on optical waveguide arrays by synchrotron radiation microtomography / Manescu, Adrian; DI GREGORIO, G. M.; Girardin, Emmanuelle; Calbucci, Vittorio; Angeloni, G.; Carta, P.; Giuliani, Alessandra; Albertini, Gianni. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - 11:4(2011), pp. 548-550. [10.1109/TDMR.2011.2168562]
Defect analysis on optical waveguide arrays by synchrotron radiation microtomography
MANESCU, Adrian;GIRARDIN, Emmanuelle;CALBUCCI, VITTORIO;GIULIANI, ALESSANDRA;ALBERTINI, GIANNI
2011-01-01
Abstract
In recent years, great attention has been devoted to the study and realization of polymeric optical waveguides embedded in printed circuit boards due to the increasing need of transferring large amounts of data at high speed within computer and telecommunication devices. Nonuniform microstructural defects that can be induced during the manufacturing process can dramatically influence the waveguide performance. The synchrotron radiation computed microtomography technique was used to obtain 3-D microstructural information, specifically to observe small defects, such as porosities, in a nondestructive way. Porosity level and pore size range were evaluated.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
