In this paper we describe how to define and build a set of known loads to be used in Near Field Microwave Microscopy. Such loads are necessary to set up a microwave calibration kit, enabling local quantitative measurements by the microscope. The proposed protocol is validated through the microscopy system we have recently developed, that combines a Scanning Tunneling Microscope (STM) and a 70 GHz Vector Network Analyzer (VNA).
Calibration Protocol for Broadband Near-Field Microwave Microscopy / Farina, Marco; Mencarelli, Davide; DI DONATO, Andrea; Venanzoni, Giuseppe; Morini, Antonio. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 59:10(2011), pp. 2769-2776. [10.1109/TMTT.2011.2161328]
Calibration Protocol for Broadband Near-Field Microwave Microscopy
FARINA, Marco;MENCARELLI, Davide;DI DONATO, Andrea;VENANZONI, Giuseppe;MORINI, Antonio
2011-01-01
Abstract
In this paper we describe how to define and build a set of known loads to be used in Near Field Microwave Microscopy. Such loads are necessary to set up a microwave calibration kit, enabling local quantitative measurements by the microscope. The proposed protocol is validated through the microscopy system we have recently developed, that combines a Scanning Tunneling Microscope (STM) and a 70 GHz Vector Network Analyzer (VNA).I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
