Lead zirconate titanate (PZT) films deposited by sol-gel on MgO substrates have been studied by glancing angle X-ray diffraction (GAD) and scanning (SEM) and transmission (TEM) electron microscopy. To study the possibility of growing preferentially oriented films, two different compositions were considered: Pb(Zr0.52Ti0.48)O3 and Pb(Zr0.2Ti0.8)O3. Preliminary results suggest that a preferential orientation occurs depending on the film composition. In particular, a higher Ti content seems to favour the orientation along the [001] direction.
Crystallisation of perovskite PZT films on MgO substrates / Barucca, Gianni; DE BENEDITTIS, A.; DI CRISTOFORO, A.; Majni, Giuseppe; Mengucci, Paolo; Leccabue, F.; Watts, B. E.. - In: THIN SOLID FILMS. - ISSN 0040-6090. - 319:(1998), pp. 207-210.
Crystallisation of perovskite PZT films on MgO substrates
BARUCCA, Gianni;MAJNI, GIUSEPPE;MENGUCCI, Paolo;
1998-01-01
Abstract
Lead zirconate titanate (PZT) films deposited by sol-gel on MgO substrates have been studied by glancing angle X-ray diffraction (GAD) and scanning (SEM) and transmission (TEM) electron microscopy. To study the possibility of growing preferentially oriented films, two different compositions were considered: Pb(Zr0.52Ti0.48)O3 and Pb(Zr0.2Ti0.8)O3. Preliminary results suggest that a preferential orientation occurs depending on the film composition. In particular, a higher Ti content seems to favour the orientation along the [001] direction.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
