An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave microscope setup is reported.
Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy / Farina, Marco; Lucesoli, Agnese; DI DONATO, Andrea; Mencarelli, Davide; Maccari, Luca; Venanzoni, Giuseppe; Morini, Antonio; Rozzi, Tullio. - In: ELECTRONICS LETTERS. - ISSN 0013-5194. - STAMPA. - 46:(2010), pp. 50-52. [10.1049/el.2010.2859]
Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy
FARINA, Marco;LUCESOLI, AGNESE;DI DONATO, Andrea;MENCARELLI, Davide;MACCARI, LUCA;VENANZONI, Giuseppe;MORINI, ANTONIO;ROZZI, TULLIO
2010-01-01
Abstract
An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave microscope setup is reported.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
