An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave microscope setup is reported.

Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy

FARINA, Marco;LUCESOLI, AGNESE;DI DONATO, Andrea;MENCARELLI, Davide;MACCARI, LUCA;VENANZONI, Giuseppe;MORINI, ANTONIO;ROZZI, TULLIO
2010-01-01

Abstract

An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave microscope setup is reported.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/51071
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