A calibration approach for the segmentation and analysis of microwave circuits

This paper introduces a general method for the analysis of the individual blocks forming a complex circuit by measurements or simulations carried out on the whole. This is useful in those situations where the analysis of the single blocks is difficult. Paradoxically, the analysis of more complex structures, which contain individual elements, as subcircuits is, in some circumstances, easier to perform or may even be the only way to acquire information about the individual elements. Under certain conditions, the elements can be combined to obtain different circuits according to classic segmentation technique. Owing to its formulation, the method is applicable to both simulation and measurement problems.