Random device variations are a key factor limiting the performances of high-resolution CMOS current steering D/A converters. In this paper a novel design methodology based on statistical modeling of MOS drain current has been developed. This technique requires firstly an estimation of mean value and autocorrelation function of a single stochastic process, which all the process/device variations are lumped in. Then a behavioral model of D/A converters has been developed. Finally, the statistical simulation of static performances (DNL and INL) has been carried out for different DAC architectures.
A statistical methodology for the design of high-performance current steering DAC's / Crippa, Paolo; Conti, Massimo; Turchetti, Claudio. - 5:(2001), pp. 311-314. (Intervento presentato al convegno The 2001 IEEE International Symposium on Circuits and Systems, 2001 (ISCAS 2001) tenutosi a Sydney, NSW, Australia nel 6 - 9 Maggio 2001) [10.1109/ISCAS.2001.922047].
A statistical methodology for the design of high-performance current steering DAC's
CRIPPA, Paolo;CONTI, MASSIMO;TURCHETTI, Claudio
2001-01-01
Abstract
Random device variations are a key factor limiting the performances of high-resolution CMOS current steering D/A converters. In this paper a novel design methodology based on statistical modeling of MOS drain current has been developed. This technique requires firstly an estimation of mean value and autocorrelation function of a single stochastic process, which all the process/device variations are lumped in. Then a behavioral model of D/A converters has been developed. Finally, the statistical simulation of static performances (DNL and INL) has been carried out for different DAC architectures.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
