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EnglishRandom device variations are a key factor limiting the performances of high-resolution CMOS current steering D/A converters. In this paper a novel design methodology based on statistical modeling of MOS drain current has been developed. This technique requires firstly an estimation of mean value and autocorrelation function of a single stochastic process, which all the process/device variations are lumped in. Then a behavioral model of D/A converters has been developed. Finally, the statistical simulation of static performances (DNL and INL) has been carried out for different DAC architectures.
| Titolo: | A statistical methodology for the design of high-performance current steering DAC's | |
| Autori: | ||
| Data di pubblicazione: | 2001 | |
| Abstract: | Random device variations are a key factor limiting the performances of high-resolution CMOS current steering D/A converters. In this paper a novel design methodology based on statistical modeling of MOS drain current has been developed. This technique requires firstly an estimation of mean value and autocorrelation function of a single stochastic process, which all the process/device variations are lumped in. Then a behavioral model of D/A converters has been developed. Finally, the statistical simulation of static performances (DNL and INL) has been carried out for different DAC architectures. | |
| Handle: | http://hdl.handle.net/11566/47082 | |
| ISBN: | 9780780366855 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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