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EnglishReal planar structures, in contrast to ideal ones, involve lossy conductors of finite thickness even when neglecting dielectric losses: these characteristics play a fundamental role in MMIC interconnecting lines. A full-wave approach to the modelling of their dispersion characteristics is introduced, suitable for open structures. The method is a continuous spectral domain formulation of the generalised transverse resonance-diffraction (G-TRD). As the standard G-TRD, its open counterpart could also be used to model linear active devices.
| Titolo: | Spectral Domain Approach to the 2D Modeling of Open Microstrips with Thick Lossy Conductors |
| Autori: | |
| Data di pubblicazione: | 2000 |
| Rivista: | |
| Abstract: | Real planar structures, in contrast to ideal ones, involve lossy conductors of finite thickness even when neglecting dielectric losses: these characteristics play a fundamental role in MMIC interconnecting lines. A full-wave approach to the modelling of their dispersion characteristics is introduced, suitable for open structures. The method is a continuous spectral domain formulation of the generalised transverse resonance-diffraction (G-TRD). As the standard G-TRD, its open counterpart could also be used to model linear active devices. |
| Handle: | http://hdl.handle.net/11566/36457 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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