Real planar structures, in contrast to ideal ones, involve lossy conductors of finite thickness even when neglecting dielectric losses: these characteristics play a fundamental role in MMIC interconnecting lines. A full-wave approach to the modelling of their dispersion characteristics is introduced, suitable for open structures. The method is a continuous spectral domain formulation of the generalised transverse resonance-diffraction (G-TRD). As the standard G-TRD, its open counterpart could also be used to model linear active devices.

Spectral domain approach to 2D-modelling of open planar structures with thick lossy conductors / Farina, Marco; Rozzi, Tullio. - In: IEE PROCEEDINGS. MICROWAVES, ANTENNAS AND PROPAGATION. - ISSN 1350-2417. - 147 no. 5:(2000), pp. 321-324.

Spectral domain approach to 2D-modelling of open planar structures with thick lossy conductors

FARINA, Marco;ROZZI, TULLIO
2000-01-01

Abstract

Real planar structures, in contrast to ideal ones, involve lossy conductors of finite thickness even when neglecting dielectric losses: these characteristics play a fundamental role in MMIC interconnecting lines. A full-wave approach to the modelling of their dispersion characteristics is introduced, suitable for open structures. The method is a continuous spectral domain formulation of the generalised transverse resonance-diffraction (G-TRD). As the standard G-TRD, its open counterpart could also be used to model linear active devices.
2000
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/36457
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