Real planar structures, in contrast to ideal ones, involve lossy conductors of finite thickness even when neglecting dielectric losses: these characteristics play a fundamental role in MMIC interconnecting lines. A full-wave approach to the modelling of their dispersion characteristics is introduced, suitable for open structures. The method is a continuous spectral domain formulation of the generalised transverse resonance-diffraction (G-TRD). As the standard G-TRD, its open counterpart could also be used to model linear active devices.
Spectral domain approach to 2D-modelling of open planar structures with thick lossy conductors / Farina, Marco; Rozzi, Tullio. - In: IEE PROCEEDINGS. MICROWAVES, ANTENNAS AND PROPAGATION. - ISSN 1350-2417. - 147 no. 5:(2000), pp. 321-324.
Spectral domain approach to 2D-modelling of open planar structures with thick lossy conductors
FARINA, Marco;ROZZI, TULLIO
2000-01-01
Abstract
Real planar structures, in contrast to ideal ones, involve lossy conductors of finite thickness even when neglecting dielectric losses: these characteristics play a fundamental role in MMIC interconnecting lines. A full-wave approach to the modelling of their dispersion characteristics is introduced, suitable for open structures. The method is a continuous spectral domain formulation of the generalised transverse resonance-diffraction (G-TRD). As the standard G-TRD, its open counterpart could also be used to model linear active devices.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.