A scanning probe microscope including a holder having at least one electric port, wherein the holder is configured to support a sample to be imaged. The scanning probe micro scope further includes a probe and an actuator configured to move at least one of the holder and the probe up to three directions. The scanning probe microscope further includes a reflectometer configured to measure reflection and / or transmission coefficients at each of the at least one electric ports of the holder by feeding each of the at least one electric ports of the holder with electromagnetic wave signals.
SCANNING PROBE MICROSCOPE WITH A SAMPLE HOLDER FED WITH ELECTROMAGNETIC WAVE SIGNALS / Farina, Marco. - (2019).
SCANNING PROBE MICROSCOPE WITH A SAMPLE HOLDER FED WITH ELECTROMAGNETIC WAVE SIGNALS
Marco Farina
2019-01-01
Abstract
A scanning probe microscope including a holder having at least one electric port, wherein the holder is configured to support a sample to be imaged. The scanning probe micro scope further includes a probe and an actuator configured to move at least one of the holder and the probe up to three directions. The scanning probe microscope further includes a reflectometer configured to measure reflection and / or transmission coefficients at each of the at least one electric ports of the holder by feeding each of the at least one electric ports of the holder with electromagnetic wave signals.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
