The effect of measurement errors in the S-matrix of a reciprocal 2-port device is recognized in the (usually low) difference between S12 and S21, as the device is nonreciprocal. This “false non- reciprocity” is analyzed in this paper, and it is verified that, for low loss device, the difference acts principally on the phases of S12 and S21. This anomaly can be removed if a numerical correction is applied to the experimental S-matrix. In doing so, it is proved that the residual measurement errors have comparable amplitudes on all scattering parameters.

ANALYSIS OF ``FALSE NON RECIPROCITY'' IN 2-PORT VNA MEASUREMENTS OF RECIPROCAL DEVICES / Zappelli, Leonardo. - In: PROGRESS IN ELECTROMAGNETICS RESEARCH M. - ISSN 1937-8726. - ELETTRONICO. - 90:(2020), pp. 1-8. [10.2528/PIERM19110903]

ANALYSIS OF ``FALSE NON RECIPROCITY'' IN 2-PORT VNA MEASUREMENTS OF RECIPROCAL DEVICES

Zappelli, Leonardo
2020-01-01

Abstract

The effect of measurement errors in the S-matrix of a reciprocal 2-port device is recognized in the (usually low) difference between S12 and S21, as the device is nonreciprocal. This “false non- reciprocity” is analyzed in this paper, and it is verified that, for low loss device, the difference acts principally on the phases of S12 and S21. This anomaly can be removed if a numerical correction is applied to the experimental S-matrix. In doing so, it is proved that the residual measurement errors have comparable amplitudes on all scattering parameters.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/276653
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