In this talk we will review the principles of the Scanning Probe Microscopy techniques used by our group, detailing the working principles of some techniques introduced by ourselves and describing recent results. In particular we will describe and discuss a broad-band Near Field Scanning Microwave Microscopy approach, along with its use in time-domain, and an infrared interferometric technique enabling tomographic mapping of samples.
High Resolution Imaging at nanoscale by Scanning Probe Microscopy / Farina, Marco. - ELETTRONICO. - (2015).
High Resolution Imaging at nanoscale by Scanning Probe Microscopy
FARINA, Marco
2015-01-01
Abstract
In this talk we will review the principles of the Scanning Probe Microscopy techniques used by our group, detailing the working principles of some techniques introduced by ourselves and describing recent results. In particular we will describe and discuss a broad-band Near Field Scanning Microwave Microscopy approach, along with its use in time-domain, and an infrared interferometric technique enabling tomographic mapping of samples.File in questo prodotto:
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