Scanning Probe Microscopy for Nanotechnology: from Microwaves to Infrared imaging

Scanning Probe Microscopy relies on the use of short-range interactions between a probe and a sample, the probe being raster scanned near the surface of a sample (or vice-versa). The nature of the interaction defines the type of microscope. Aim of this presentation is to introduce the latest developments on two completely different approaches exploiting electromagnetic waves. The first one exploits the near-field in the microwave and millimetre wave range, while the second one makes use of an optical Fabry-Perot microcavity to achieve a lens-free infrared tomography. While the near field microwave microscope allows to achieve nanometric resolution, the infrared imaging directly produces tomographic information, and both are minimally or non-invasive.