—A technique is described to measure the generalized scattering matrix (GSM) of a waveguide device whose ports are multimodal. The device-under-test is placed in between suitable converters, thereby transforming multimodal ports into monomodal ports. The needed data are then measured using a standard vector network analyzer. A dedicated algorithm is finally used to recover the multimode GSM of the device. The experimental validation is reported in this paper for rectangular and square waveguides showing excellent agreement between theory and measured results.

A Technique for the Measurement of the Generalized Scattering Matrix of Overmoded Waveguide Devices / Morini, Antonio; Marco, Guglielmi; Farina, Marco. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 61:7(2013), pp. 2705-2714. [10.1109/TMTT.2013.2265683]

A Technique for the Measurement of the Generalized Scattering Matrix of Overmoded Waveguide Devices

MORINI, ANTONIO
Primo
Methodology
;
FARINA, Marco
Ultimo
Conceptualization
2013-01-01

Abstract

—A technique is described to measure the generalized scattering matrix (GSM) of a waveguide device whose ports are multimodal. The device-under-test is placed in between suitable converters, thereby transforming multimodal ports into monomodal ports. The needed data are then measured using a standard vector network analyzer. A dedicated algorithm is finally used to recover the multimode GSM of the device. The experimental validation is reported in this paper for rectangular and square waveguides showing excellent agreement between theory and measured results.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/108864
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