The aim of this paper is to propose the use of elliptical basis function probabilistic neural networks in automatic defects classification. The aim of classification is to assign a new pattern to a class, on the basis of already classified patterns. In eddy current based inspection, the patterns are sequences of complex voltages whose shape depends on the kind of defect affecting the conductive object under test. 1.

Application of Probabilistic Neural Networks to Eddy Current Non Destructive Test Problems / P., Burrascano; E., Cardelli; A., Faba; Fiori, Simone; A., Massinelli. - (2001), pp. 192-195.

Application of Probabilistic Neural Networks to Eddy Current Non Destructive Test Problems

FIORI, Simone;
2001-01-01

Abstract

The aim of this paper is to propose the use of elliptical basis function probabilistic neural networks in automatic defects classification. The aim of classification is to assign a new pattern to a class, on the basis of already classified patterns. In eddy current based inspection, the patterns are sequences of complex voltages whose shape depends on the kind of defect affecting the conductive object under test. 1.
2001
Proc. of 7th International Conference on Engineering Applications of Neural Networks (EANN'2001)
8888342001
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/75008
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact