In this work, we describe the application of an in-house system performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) to a few-layer graphene sample. This sample is produced by mechanical exfoliation of bulk highly oriented graphite and deposited on a substrate of conductive glass. By introducing the time-domain conversion of frequency domain data, we show that it is possible to achieve nanometric resolution.
High resolution imaging of few-layer graphene by Near-Field Scanning Microwave Microscopy / Monti, Tamara; DI DONATO, Andrea; Farina, Marco. - (2012), pp. 109-112. (Intervento presentato al convegno Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2012 IEEE 12th Topical Meeting on tenutosi a Santa Clara (CA) nel 16-18 Jan. 2012) [10.1109/SiRF.2012.6160156].
High resolution imaging of few-layer graphene by Near-Field Scanning Microwave Microscopy
MONTI, TAMARA;DI DONATO, Andrea;FARINA, Marco
2012-01-01
Abstract
In this work, we describe the application of an in-house system performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) to a few-layer graphene sample. This sample is produced by mechanical exfoliation of bulk highly oriented graphite and deposited on a substrate of conductive glass. By introducing the time-domain conversion of frequency domain data, we show that it is possible to achieve nanometric resolution.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
