The successful application of FD-TD methods to millimetric planar transmission lines presupposes a satisfactory answer to the problem of infinite line termination (Absorbing Boundary Condition ABC) in presence of high frequency dispersion. It is the purpose of this work to evaluate the efficiency of some commonly employed ABC's and to present a technique that reduces reflection error to less than 10\% for microstrip and coplanar line circuits up to and beyond 50 GHz. that is lower than the discretization and round-off errors introduced by the very FD-TD technique. We report some examples of microstrip and coplanar line, comparing results with those obtained by other authors as well as with those of commercial packages and with experimental data.

Discontinuities in planar millimetric circuits by FD-TD method / Moglie, Franco; Rozzi, Tullio; M., Manini; R., Severini. - (1994), pp. 327-330. (Intervento presentato al convegno Second International Conference on Computation in Electromagnetics tenutosi a London, UK nel 12-14 April 1994) [10.1049/cp:19940083].

Discontinuities in planar millimetric circuits by FD-TD method

MOGLIE, FRANCO;ROZZI, TULLIO;
1994-01-01

Abstract

The successful application of FD-TD methods to millimetric planar transmission lines presupposes a satisfactory answer to the problem of infinite line termination (Absorbing Boundary Condition ABC) in presence of high frequency dispersion. It is the purpose of this work to evaluate the efficiency of some commonly employed ABC's and to present a technique that reduces reflection error to less than 10\% for microstrip and coplanar line circuits up to and beyond 50 GHz. that is lower than the discretization and round-off errors introduced by the very FD-TD technique. We report some examples of microstrip and coplanar line, comparing results with those obtained by other authors as well as with those of commercial packages and with experimental data.
1994
0852966091
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/66645
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? 1
social impact