In this work we describe the application of a dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) - developed by ourselves- to a graphene flake. In our system we introduce a conversion in Time-Domain to discriminate the desired information, achieving high quality microwave images with nanometric resolution. The graphene sample is deposited on a substrate of SiO2 with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidence of localized change of impedance near the edge of the flake.
Broadband Scanning Microwave Microscopy Investigation of Graphene / Fabiani, S.; Mencarelli, D.; Di Donato, A.; Monti, T.; Venanzoni, G.; Morini, A.; Rozzi, T.; Farina, M.. - 2011:(2011). (Intervento presentato al convegno Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International tenutosi a Baltimore nel Giugno 2011) [10.1109/MWSYM.2011.5972890].
Broadband Scanning Microwave Microscopy Investigation of Graphene
S. Fabiani;D. Mencarelli;A. Di Donato;T. Monti;G. Venanzoni;A. Morini;T. Rozzi;M. Farina
2011-01-01
Abstract
In this work we describe the application of a dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) - developed by ourselves- to a graphene flake. In our system we introduce a conversion in Time-Domain to discriminate the desired information, achieving high quality microwave images with nanometric resolution. The graphene sample is deposited on a substrate of SiO2 with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidence of localized change of impedance near the edge of the flake.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
