This work describes a wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) developed in our laboratory. The system is an STM-assisted, apertureless microscope featuring nanometric resolution. The system does not exploits resonators -even though parasitic resonances do exist anyway indeed- and records directly the reflection coefficient by means of a 67 GHz VNA. The resolution is improved by a method of tip etching, while the consequent reduced sensitivity is compensated by a post-processing algorithm
A Broad-Band Microwave Scanning Probe Microscope / Farina, Marco; DI DONATO, Andrea; Fabiani, Silvia; Lucesoli, Agnese; Monti, Tamara; Mencarelli, Davide; Venanzoni, Giuseppe; Morini, Antonio; Rozzi, Tullio. - (2011). (Intervento presentato al convegno MEMSWAVE 2010 tenutosi a Otranto nel Giugno 2010).
A Broad-Band Microwave Scanning Probe Microscope
FARINA, Marco;DI DONATO, Andrea;FABIANI, SILVIA;LUCESOLI, AGNESE;MONTI, TAMARA;MENCARELLI, Davide;VENANZONI, Giuseppe;MORINI, ANTONIO;ROZZI, TULLIO
2011-01-01
Abstract
This work describes a wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) developed in our laboratory. The system is an STM-assisted, apertureless microscope featuring nanometric resolution. The system does not exploits resonators -even though parasitic resonances do exist anyway indeed- and records directly the reflection coefficient by means of a 67 GHz VNA. The resolution is improved by a method of tip etching, while the consequent reduced sensitivity is compensated by a post-processing algorithmI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
