This work describes a wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) developed in our laboratory. The system is an STM-assisted, apertureless microscope featuring nanometric resolution. The system does not exploits resonators -even though parasitic resonances do exist anyway indeed- and records directly the reflection coefficient by means of a 67 GHz VNA. The resolution is improved by a method of tip etching, while the consequent reduced sensitivity is compensated by a post-processing algorithm

A Broad-Band Microwave Scanning Probe Microscope

FARINA, Marco;DI DONATO, Andrea;FABIANI, SILVIA;LUCESOLI, AGNESE;MONTI, TAMARA;MENCARELLI, Davide;VENANZONI, Giuseppe;MORINI, ANTONIO;ROZZI, TULLIO
2011-01-01

Abstract

This work describes a wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) developed in our laboratory. The system is an STM-assisted, apertureless microscope featuring nanometric resolution. The system does not exploits resonators -even though parasitic resonances do exist anyway indeed- and records directly the reflection coefficient by means of a 67 GHz VNA. The resolution is improved by a method of tip etching, while the consequent reduced sensitivity is compensated by a post-processing algorithm
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/50292
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