This paper proposes an accurate analysis of Microelectromechnanical (MEM) switches using the Lumped Element-Finite Difference Time Domain (LE-FDTD) method enriched of the Short-Open Calibration (SOC) technique. The application of this method allows the electrical behavior of MEM switches to be accurately predicted while reducing the computational CPU time.
Short-Open Calibration Technique for Accurate LE-FDTD Simulation of MEM Switches
FARINA, Marco;
2002-01-01
Abstract
This paper proposes an accurate analysis of Microelectromechnanical (MEM) switches using the Lumped Element-Finite Difference Time Domain (LE-FDTD) method enriched of the Short-Open Calibration (SOC) technique. The application of this method allows the electrical behavior of MEM switches to be accurately predicted while reducing the computational CPU time.File in questo prodotto:
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