This paper proposes an accurate analysis of Microelectromechnanical (MEM) switches using the Lumped Element-Finite Difference Time Domain (LE-FDTD) method enriched of the Short-Open Calibration (SOC) technique. The application of this method allows the electrical behavior of MEM switches to be accurately predicted while reducing the computational CPU time.
Titolo: | Short-Open Calibration Technique for Accurate LE-FDTD Simulation of MEM Switches |
Autori: | |
Data di pubblicazione: | 2002 |
Abstract: | This paper proposes an accurate analysis of Microelectromechnanical (MEM) switches using the Lumped Element-Finite Difference Time Domain (LE-FDTD) method enriched of the Short-Open Calibration (SOC) technique. The application of this method allows the electrical behavior of MEM switches to be accurately predicted while reducing the computational CPU time. |
Handle: | http://hdl.handle.net/11566/47919 |
ISBN: | 9780862132088 |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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