We introduce a new TLM node approach for the analysis of wave-propagation in electro-optical devices. The present model accounts for both permittivity and permeability tensors of the material. The node scattering matrix is derived by using centered differences and averages. The novel aspect is that stub-loaded reactances are derived by consideration of the refractive-index ellipsoid

A TLM-symmetrical condensed node approach for general anisotropic optical and microwave devices

PIERANTONI, Luca;ROZZI, TULLIO
2003-01-01

Abstract

We introduce a new TLM node approach for the analysis of wave-propagation in electro-optical devices. The present model accounts for both permittivity and permeability tensors of the material. The node scattering matrix is derived by using centered differences and averages. The novel aspect is that stub-loaded reactances are derived by consideration of the refractive-index ellipsoid
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/41129
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