We introduce a new TLM node approach for the analysis of wave-propagation in electro-optical devices. The present model accounts for both permittivity and permeability tensors of the material. The node scattering matrix is derived by using centered differences and averages. The novel aspect is that stub-loaded reactances are derived by consideration of the refractive-index ellipsoid
A TLM-symmetrical condensed node approach for general anisotropic optical and microwave devices / Pierantoni, Luca; Santantoni, C.; Rozzi, Tullio. - (2003), pp. 725-728. (Intervento presentato al convegno Antennas and Propagation Society International Symposium, 2003. IEEE tenutosi a Columbus, Ohio, USA nel 22-27 June 2003) [10.1109/URSIGASS.2011.6050395].