special issue: Nanomaterials by Severe Plastic Deformation IV
Shear induced low- and high-angle boundary characterization using Kikuchi bands in transmission electron microscopy / Cabibbo, Marcello. - 584-586:(2008), pp. 293-299.
Shear induced low- and high-angle boundary characterization using Kikuchi bands in transmission electron microscopy
CABIBBO, MARCELLO
2008-01-01
Abstract
special issue: Nanomaterials by Severe Plastic Deformation IVFile in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.