High resolution Digital-to-Analog Converters (DACs) are known to be characterized by static testing procedures with a remarkable duration, due to the huge number of employed codes. This paper proposes a method that allows to reconstruct the Integral Non-Linearity through the Compressed Sensing, by measuring the DAC output on a reduced number of codes. The proposed reduced-code test is evaluated for several compression ratios, turning out well performing in terms of Root Mean Square Error.
A CS method for DAC nonlinearity testing / Daponte, P.; de Vito, L.; Iadarola, G.; Rapuano, S.. - (2020), pp. 146-150. (Intervento presentato al convegno 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, IWADC 2020 tenutosi a ita nel 2020).
A CS method for DAC nonlinearity testing
Daponte P.;Iadarola G.;
2020-01-01
Abstract
High resolution Digital-to-Analog Converters (DACs) are known to be characterized by static testing procedures with a remarkable duration, due to the huge number of employed codes. This paper proposes a method that allows to reconstruct the Integral Non-Linearity through the Compressed Sensing, by measuring the DAC output on a reduced number of codes. The proposed reduced-code test is evaluated for several compression ratios, turning out well performing in terms of Root Mean Square Error.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
