Near-field Scanning Microwave Microscopy (SMM) makes use of a high frequency signal to image and characterize electrical properties of samples. Recently, a new SMM setup was developed, the so called inverted-SMM (iSMM), whose biocompatibility allows its application to sample of biological interest. The experimental arrangement of the iSMM combines an Atomic Force Microscope (AFM), a Vector Network Analyser (VNA) and a slot line as a sample holder. In this work, a calibration protocol for reflection mode measurements is applied to the imaging of biological samples, in particular Jurkat cells. The complex local admittance of a single cell is extracted and the dielectric constant is estimated to be around 2.6 ± 0.3. Thus, the first quantitative characterization of iSMM operating in reflection mode is reported, as well as the first electrical characterization of Jurkat cells by this tool.
Electrical properties of Jurkat cells: An inverted scanning microwave microscope study
Fabi G.
;Farina M.
2020-01-01
Abstract
Near-field Scanning Microwave Microscopy (SMM) makes use of a high frequency signal to image and characterize electrical properties of samples. Recently, a new SMM setup was developed, the so called inverted-SMM (iSMM), whose biocompatibility allows its application to sample of biological interest. The experimental arrangement of the iSMM combines an Atomic Force Microscope (AFM), a Vector Network Analyser (VNA) and a slot line as a sample holder. In this work, a calibration protocol for reflection mode measurements is applied to the imaging of biological samples, in particular Jurkat cells. The complex local admittance of a single cell is extracted and the dielectric constant is estimated to be around 2.6 ± 0.3. Thus, the first quantitative characterization of iSMM operating in reflection mode is reported, as well as the first electrical characterization of Jurkat cells by this tool.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
