Near-field Scanning Microwave Microscopy (SMM) makes use of a high frequency signal to image and characterize electrical properties of samples. Recently, a new SMM setup was developed, the so called inverted-SMM (iSMM), whose biocompatibility allows its application to sample of biological interest. The experimental arrangement of the iSMM combines an Atomic Force Microscope (AFM), a Vector Network Analyser (VNA) and a slot line as a sample holder. In this work, a calibration protocol for reflection mode measurements is applied to the imaging of biological samples, in particular Jurkat cells. The complex local admittance of a single cell is extracted and the dielectric constant is estimated to be around 2.6 ± 0.3. Thus, the first quantitative characterization of iSMM operating in reflection mode is reported, as well as the first electrical characterization of Jurkat cells by this tool.

Electrical properties of Jurkat cells: An inverted scanning microwave microscope study

Fabi G.
;
Farina M.
2020-01-01

Abstract

Near-field Scanning Microwave Microscopy (SMM) makes use of a high frequency signal to image and characterize electrical properties of samples. Recently, a new SMM setup was developed, the so called inverted-SMM (iSMM), whose biocompatibility allows its application to sample of biological interest. The experimental arrangement of the iSMM combines an Atomic Force Microscope (AFM), a Vector Network Analyser (VNA) and a slot line as a sample holder. In this work, a calibration protocol for reflection mode measurements is applied to the imaging of biological samples, in particular Jurkat cells. The complex local admittance of a single cell is extracted and the dielectric constant is estimated to be around 2.6 ± 0.3. Thus, the first quantitative characterization of iSMM operating in reflection mode is reported, as well as the first electrical characterization of Jurkat cells by this tool.
978-1-7281-6815-9
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/288363
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? ND
social impact