Near-field Scanning Microwave Microscopy (SMM) makes use of a high frequency signal to image and characterize electrical properties of samples. Recently, a new SMM setup was developed, the so called inverted-SMM (iSMM), whose biocompatibility allows its application to sample of biological interest. The experimental arrangement of the iSMM combines an Atomic Force Microscope (AFM), a Vector Network Analyser (VNA) and a slot line as a sample holder. In this work, a calibration protocol for reflection mode measurements is applied to the imaging of biological samples, in particular Jurkat cells. The complex local admittance of a single cell is extracted and the dielectric constant is estimated to be around 2.6 ± 0.3. Thus, the first quantitative characterization of iSMM operating in reflection mode is reported, as well as the first electrical characterization of Jurkat cells by this tool.

Electrical properties of Jurkat cells: An inverted scanning microwave microscope study / Fabi, G.; Joseph, C. H.; Jin, X.; Wang, X.; Pietrangelo, T.; Cheng, X.; Hwang, J. C. M.; Farina, M.. - 2020-:(2020), pp. 237-240. (Intervento presentato al convegno 2020 IEEE/MTT-S International Microwave Symposium, IMS 2020 tenutosi a Los Angeles (CA) USA nel 2020) [10.1109/IMS30576.2020.9223785].

Electrical properties of Jurkat cells: An inverted scanning microwave microscope study

Fabi G.
;
Joseph C. H.;Farina M.
2020-01-01

Abstract

Near-field Scanning Microwave Microscopy (SMM) makes use of a high frequency signal to image and characterize electrical properties of samples. Recently, a new SMM setup was developed, the so called inverted-SMM (iSMM), whose biocompatibility allows its application to sample of biological interest. The experimental arrangement of the iSMM combines an Atomic Force Microscope (AFM), a Vector Network Analyser (VNA) and a slot line as a sample holder. In this work, a calibration protocol for reflection mode measurements is applied to the imaging of biological samples, in particular Jurkat cells. The complex local admittance of a single cell is extracted and the dielectric constant is estimated to be around 2.6 ± 0.3. Thus, the first quantitative characterization of iSMM operating in reflection mode is reported, as well as the first electrical characterization of Jurkat cells by this tool.
2020
978-1-7281-6815-9
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/288363
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