The reverberation chamber can be used for the analysis of the behavior of a device under test irradiated by a random excitation such as plane waves. The finite-diffence time-domain method is adopted in order to analyze this behavior by using a summation of random plane waves instead of simulating the whole chamber. The considered device is a simple PCB, stressed by random source provided by this superposition.

Efficient Simulations of Field-to-PCBs Coupling Under Random Excitation / Bastianelli, L.; Moglie, F.; Gradoni, G.; Primiani, V. Mariani. - ELETTRONICO. - (2019), pp. 1097-1098. (Intervento presentato al convegno 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA) tenutosi a Granada, Spain nel 9-13 Sept. 2019) [10.1109/ICEAA.2019.8879325].

Efficient Simulations of Field-to-PCBs Coupling Under Random Excitation

Bastianelli, L.
Writing – Original Draft Preparation
;
Moglie, F.
Writing – Review & Editing
;
Gradoni, G.
Writing – Review & Editing
;
Primiani, V. Mariani
Writing – Review & Editing
2019-01-01

Abstract

The reverberation chamber can be used for the analysis of the behavior of a device under test irradiated by a random excitation such as plane waves. The finite-diffence time-domain method is adopted in order to analyze this behavior by using a summation of random plane waves instead of simulating the whole chamber. The considered device is a simple PCB, stressed by random source provided by this superposition.
2019
978-1-7281-0563-5
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/271578
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