Near-field scanning microwave microscopy (SMM) is a technique gaining popularity for the study of the electrical properties of both soft and hard matter on the nanometer scale. Despite the current focus on semiconductors, the applications of SMM on new two-dimensional materials such as platinum diselenide (PtSe 2 ) are still in an initial stage. In this work, the imaging capabilities of an innovative SMM and the analysis of the electrical properties of PtSe 2 are demonstrated.
Inverted Scanning Microwave Microscopy for Nanometer-scale Imaging and Characterization of Platinum Diselenide / Fabi, Gianluca; Jin, Xin; Hwang, James C. M.; Joseph, C. H.; Pavoni, Eleonora; Li, Lei; Xiong, Kuanchen; Ning, Yaqing; Mencarelli, Davide; di Donato, Andrea; Morini, Antonio; Zhao, Yan; Al Hadi, Richard; Farina, Marco. - (2019), pp. 1115-1117. (Intervento presentato al convegno IEEE International Microwave Symposium tenutosi a Boston (USA) nel 2-7 Giugno 2019) [10.1109/MWSYM.2019.8701124].
Inverted Scanning Microwave Microscopy for Nanometer-scale Imaging and Characterization of Platinum Diselenide
Fabi, Gianluca;Joseph, C. H.;Pavoni, Eleonora;Mencarelli, Davide;di Donato, Andrea;Morini, Antonio;Farina, Marco
2019-01-01
Abstract
Near-field scanning microwave microscopy (SMM) is a technique gaining popularity for the study of the electrical properties of both soft and hard matter on the nanometer scale. Despite the current focus on semiconductors, the applications of SMM on new two-dimensional materials such as platinum diselenide (PtSe 2 ) are still in an initial stage. In this work, the imaging capabilities of an innovative SMM and the analysis of the electrical properties of PtSe 2 are demonstrated.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
