Time-Domain Reflectometry (TDR) is a well-well known technique, widely used in several fields, such as signal integrity and remote sensing. Here we show that TDR can be conveniently used in the Near-Field Scanning Microwave Microscopy, regardless the apparent mismatch between timescales involved at nanoscale and the period of a microwave signal. The technique is demonstrated on Highly Oriented Pyrolitic Graphite (HOPG) and CVD graphene.
Time-Domain Reflectometry for Near-Field Scanning Microwave Microscopy / Farina, Marco; DI DONATO, Andrea; Mencarelli, Davide; Venanzoni, Giuseppe; Morini, Antonio; Pietrangelo, Tiziana. - (2015), pp. 1-4. (Intervento presentato al convegno IEEE MTT-S International Microwave Symposium (IMS 2015) tenutosi a Phoenix (AZ, USA) nel 17-22 Maggio 2015) [10.1109/MWSYM.2015.7167015].
Time-Domain Reflectometry for Near-Field Scanning Microwave Microscopy
FARINA, Marco;DI DONATO, Andrea;MENCARELLI, Davide;VENANZONI, Giuseppe;MORINI, ANTONIO;
2015-01-01
Abstract
Time-Domain Reflectometry (TDR) is a well-well known technique, widely used in several fields, such as signal integrity and remote sensing. Here we show that TDR can be conveniently used in the Near-Field Scanning Microwave Microscopy, regardless the apparent mismatch between timescales involved at nanoscale and the period of a microwave signal. The technique is demonstrated on Highly Oriented Pyrolitic Graphite (HOPG) and CVD graphene.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
