An essential step for studying and efficiently exploiting microwave fields in materials processing is the dielectric characterization of the samples to be treated. The dielectric behavior of a material determines the degree of interaction with the electromagnetic field, and then the intrinsic efficiency of the processing. From this information it is possible to design and optimize a proper microwave applicator.
Full electromagnetic simulation of a scanning microwave microscope for quantitative estimation of material properties / Monti, Tamara; Iezzi, Pietro; Farina, Marco; Kingman, Sam W.. - (2015), pp. 1-1. (Intervento presentato al convegno URSI AT-RASC tenutosi a Canary Islands nel 16-24 maggio 2015) [10.1109/URSI-AT-RASC.2015.7303066].
Full electromagnetic simulation of a scanning microwave microscope for quantitative estimation of material properties
FARINA, Marco;
2015-01-01
Abstract
An essential step for studying and efficiently exploiting microwave fields in materials processing is the dielectric characterization of the samples to be treated. The dielectric behavior of a material determines the degree of interaction with the electromagnetic field, and then the intrinsic efficiency of the processing. From this information it is possible to design and optimize a proper microwave applicator.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
