Scanning Microwave Microscopy is a relatively recent and promising technique that is approaching technological maturity. Nonetheless there are many open issues, related to interpretation of data metrological problems. This talk will present an overview of the SMM, discussing applications and recent advances.
Near-Field Scanning Microwave Microscopy (SMM): a new tool for understanding matter and biology at the nanoscale / Farina, Marco; Mencarelli, Davide; Hwang, James C. M.. - (2017). (Intervento presentato al convegno IEEE – MTT-25 RF Nanotechnology/IHP Workshop: Graphene and 2D Materials: Application and Technology/Status Perspectives tenutosi a Frankfurt (Oder) Germany nel 16/10/2017).
Near-Field Scanning Microwave Microscopy (SMM): a new tool for understanding matter and biology at the nanoscale.
Marco Farina
;Davide Mencarelli;
2017-01-01
Abstract
Scanning Microwave Microscopy is a relatively recent and promising technique that is approaching technological maturity. Nonetheless there are many open issues, related to interpretation of data metrological problems. This talk will present an overview of the SMM, discussing applications and recent advances.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
