Synthetic optical holography (SOH) is a recent technique introduced in scanning microscopy to record amplitude and phase of a scattered field from a sample at nanoscale. In this work, we describe a compact implementation realized in optical fiber and working at infrared wavelength. The system is based on a scanning extrinsic optical microcavity and combines the low-coherence properties of the infrared laser source with the resonant behavior of a micro-cavity, in order to realize a high sensitive imaging system. Measurements were performed over a nanometric SiO2 grating, achieving a lateral resolution of about 1 pm by means of an optical fiber with a Numerical Aperture (NA) equal to 0.1 and a Mode Field Diameter (MDF) of 5.6 pm
Synthetic holography at infrared wavelength for nanostructure imaging: Scanning microscopy based on extrinsic microcavity / Di Donato, A.; Farina, M.; Stocchi, M.; Mencarelli, D.; Pierantoni, L.. - ELETTRONICO. - (2017), pp. 1-3. (Intervento presentato al convegno IEEE MTT-S Int. Micr. Workshop Series on Advan. Mat. And Proc. (IMWS-AMP 2017), tenutosi a Pavia, Italy nel Sept. 20-22, 2017) [10.1109/IMWS-AMP.2017.8247393].
Synthetic holography at infrared wavelength for nanostructure imaging: Scanning microscopy based on extrinsic microcavity
Di Donato, A.;Farina, M.;Stocchi, M.;Mencarelli, D.;Pierantoni, L.
2017-01-01
Abstract
Synthetic optical holography (SOH) is a recent technique introduced in scanning microscopy to record amplitude and phase of a scattered field from a sample at nanoscale. In this work, we describe a compact implementation realized in optical fiber and working at infrared wavelength. The system is based on a scanning extrinsic optical microcavity and combines the low-coherence properties of the infrared laser source with the resonant behavior of a micro-cavity, in order to realize a high sensitive imaging system. Measurements were performed over a nanometric SiO2 grating, achieving a lateral resolution of about 1 pm by means of an optical fiber with a Numerical Aperture (NA) equal to 0.1 and a Mode Field Diameter (MDF) of 5.6 pmI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
