The app described in this article was presented at the student design competition of the 2016 I Microwave Theory and Techniques Society (MTT-S) International Microwave Symposium. As sponsored by Technical Committee MTT-25 on F nanotechnology, the competition's objective was to develop user-friendly interfaces to facilitate the design and application of F nanotechnology. To this end, the app is capable of simulating the capacitance and charge distribution of the probe-sample interaction on a nanoscale in near-field scanning microscopes, such as the scanning microwave microscope (SMM), the atomic force microscope (AFM), and the scanning tunneling microscope (STM).

Nano Probing for Microwave ngineers: Calculating Probe-Sample Capacitance and Charge Distribution of a Near-Field Scanning Microwave Microscope on a Nanoscale / Jin, Xin; Hwang, James C. M.; Mencarelli, Davide; Pierantoni, Luca; Farina, Marco. - In: IEEE MICROWAVE MAGAZINE. - ISSN 1527-3342. - STAMPA. - 18:1(2017), pp. 71-75. [10.1109/MMM.2016.2616184]

Nano Probing for Microwave ngineers: Calculating Probe-Sample Capacitance and Charge Distribution of a Near-Field Scanning Microwave Microscope on a Nanoscale

MENCARELLI, Davide;PIERANTONI, Luca;FARINA, Marco
2017-01-01

Abstract

The app described in this article was presented at the student design competition of the 2016 I Microwave Theory and Techniques Society (MTT-S) International Microwave Symposium. As sponsored by Technical Committee MTT-25 on F nanotechnology, the competition's objective was to develop user-friendly interfaces to facilitate the design and application of F nanotechnology. To this end, the app is capable of simulating the capacitance and charge distribution of the probe-sample interaction on a nanoscale in near-field scanning microscopes, such as the scanning microwave microscope (SMM), the atomic force microscope (AFM), and the scanning tunneling microscope (STM).
2017
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11566/246079
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